Influence of Precursor Density and Conversion Time on the Orientation of Vapor-Deposited ZIF-8

ZIF-8 was synthesized by subjecting ZnO thin films deposited via plasma-enhanced atomic layer deposition to a 2-methylimidazole vapor. The impact of the conversion time as well density and thickness precursor on resulting layers were investigated. Grazing Incidence X-ray diffraction reveals preferred (100) or (111) orientation crystals, depending precursor, with more prominent at longer times. onset crystallization occurs after 20 min for less dense compared 40 denser one. roughness increase time. final depends layer, can be up 15-fold higher than thickness.